Test patterns, 2D

554822

8 Test patterns, 2D

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Description

Three test patterns (line pattern, star target, pin diaphragm) for the determination of the resolution of the Computed tomography module (554 821) or the X-ray Image Sensor (554 8281 or 554 828) and for the determination of the size of the focal spot of the used X-ray tube.

Technical data

Line pattern: 0.6 ... 3.5 LP/mm
Star target: 20 sements à 5°, 0.5 ... 3.5 LP/mm
Pin diaphragm: 0.15 mm Ø
Material thickness: 0.1 mm
Dimensions: 50 mm x 50 mm

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[554 822] Test patterns, 2D (de)

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Test patterns, 2D

Description

Technical data

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